PREPARATION AND CHARACTERISTICS OF THIN FILMS OF TITANIUM NITRIDA (TiN) ON SUBSTRATE GLASS RESULTS FROM DC SPUTTERING METHOD

1Nurfitriyana ramadhani i, Ariswan, Tjipto sujitno, , Indonesia

Abstract


Abstrak Penelitian ini bertujuan untuk membuat lapisan tipis TiN pada substrat kaca menggunakan metode sputtering DC dan karakterisasinya terhadap sifat optik menggunakan UV-Vis, morfologi dan komposisi kimia menggunakan SEM-EDS, dan struktur kristal menggunakan X-RD. Preparasi tersebut dilakukan sebanyak tiga kali dengan memvariasi waktu pendeposisian selama 30 menit, 60 menit, dan 90 menit. Selain itu, perbandingan antara gas Argon dan Nitrogen yang dialirkan sebesar 70:30. Hasil uji UV-Vis diperoleh band gap untuk waktu deposisi 30 menit sebesar 3,47 eV, 60 menit sebesar 3,59 eV, dan 90 menit sebesar 3,68 eV. Hasil uji SEM diperoleh ketebalan lapisan yang terbentuk pada waktu deposisi 60 menit sebesar 1,588 μm. Dan hasil uji EDS diperoleh presentase berat Ti sebesar 13,6%, N sebesar 51,8%, dan Si sebesar 34,6%. Hasil uji XRD lapisan TiN yang terbentuk pada substrat kaca masih terlalu tipis, sehingga sinar-X menembus lapisan dan mengenai substrat kaca yang bersifat amorf. Kata kunci: TiN, sputteing DC, UV-Vis, SEM-EDS, XRD Abstract The aim of this research is to make TiN thin layer on glass substrate using DC sputtering method and its characterization to optical properties using UV-Vis, morphology and chemical composition using SEM-EDS, and crystalline structure using X-RD. The preparation was performed three times by varying the pacing time for 30 minutes, 60 minutes, and 90 minutes. In addition, the ratio between Argon and Nitrogen gas is 70:30. UV-Vis test results obtained band gap for 30 minutes deposition time of 3.47 eV, 60 minutes of 3.59 eV, and 90 minutes of 3.68 eV. SEM test results obtained layer thickness formed at 60 minutes deposition time of 1.588 μm. And the results of EDS test obtained weight percentage of Ti by 13.6%, N by 51.8%, and Si by 34.6%. The TiN XRD test results on the glass substrate is still too thin, so the X-rays penetrate the layer and about the amorphous glass substrate Keywords: TiN, sputteing DC, UV-Vis, SEM-EDS, XRD

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DOI: https://doi.org/10.21831/fisika%20-%20s1.v7i4.11130

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